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Application Vertical 02

Ceramic components for
semiconductor manufacturing.

AlN heaters, Al₂O₃ susceptors, Si₃N₄ wafer-handling fixtures, and high-purity ceramic components for CVD/PVD chambers, lithography stages, and wafer-chuck temperature control. Zero particle generation, ultra-high purity, and tight dimensional tolerance required.

AlN
Wafer Chuck Heaters
Al₂O₃
High-purity Susceptors
±0.01mm
Dimensional Tolerance
UHP
Ultra-High Purity
Certifications & Standards
ISO 9001IATF 16949CERoHS · REACHUL Recognized
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Wafer chuck heater — 300mm platform
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01 · Wafer Chuck Heaters
★ P0 Application

Wafer chuck heaters for CVD & PVD chambers..

AlN (aluminum nitride) ceramic heaters deliver the highest thermal conductivity of any ceramic — ensuring fast, uniform wafer heating across the entire chuck surface. Critical for deposition uniformity in CVD, PECVD, and ALD processes.

Technical Requirements
Thermal conductivityAlN: 170–220 W/m·K
Temperature uniformity±1°C across 300mm wafer
Max temperatureUp to 800°C
VoltageCustom DC / AC
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Al₂O₃ susceptor — CVD reactor
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02 · Susceptors & Fixtures

Al₂O₃ susceptors for epitaxial growth..

High-purity Al₂O₃ susceptors and wafer carriers for CVD epitaxial growth reactors. Zero metallic contamination, stable at 1200°C, and dimensionally consistent batch-to-batch for process repeatability.

Technical Requirements
MaterialAl₂O₃ 99.99% purity
Max temp1200°C continuous
ContaminationZero metallic
FormDisc / ring / custom
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AlN substrate — power module
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03 · AlN Substrates

Aluminum nitride substrates for power electronics..

AlN ceramic substrates for power module and RF device packaging. Thermal conductivity 170 W/m·K — 8× higher than Al₂O₃ — enabling compact, high-power-density package designs with superior thermal dissipation.

Technical Requirements
Thermal conductivity170–220 W/m·K
Dielectric constant8.8 @ 1MHz
Size rangeCustom to drawing
Surface finishRa ≤0.4µm
High-purity Al₂O₃ process tube
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04 · High-Purity Al₂O₃

99.99% alumina for process-critical components..

Ultra-high-purity Al₂O₃ process tubes, rings, and boats for diffusion furnaces, oxidation furnaces, and ion implant equipment. Purity ≥99.99% minimises metallic contamination of silicon wafers.

Technical Requirements
Al₂O₃ purity≥99.99%
Max temp1600°C
FormTube / ring / boat
Na contamination<5 ppm
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Si₃N₄ end-effector — wafer handling
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05 · Si₃N₄ Handling Fixtures

Si₃N₄ fixtures for wafer transport..

Silicon nitride wafer end-effectors, paddles, and transfer arms for FOUP-to-chamber wafer handling. Non-magnetic, non-particle-generating, and dimensionally stable through thermal cycling.

Technical Requirements
MaterialSi₃N₄
MagneticNon-magnetic
Particle generationNear-zero
Dimensional stability±0.01mm
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Plasma etch focus ring — chamber liner
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06 · Plasma Etch Components

Ceramic components for plasma etch chambers..

Al₂O₃ and Y₂O₃-stabilised ZrO₂ focus rings, edge rings, and chamber liners for plasma etch reactors. High resistance to fluorine and chlorine plasma chemistries — longer replacement intervals reduce cost-of-ownership.

Technical Requirements
Plasma resistanceF₂ / Cl₂ resistant
MaterialAl₂O₃ / ZrO₂
FormFocus ring / liner
Lead time14 days custom
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Describe your process environment, operating temperature, chemical exposure, and annual volume. Our application engineers match you to the right ceramic and respond within one business day.

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  • Free samples, 48-hour dispatch on stock items.
  • Custom to drawing: DFM in 48h, prototype in 14 days.
  • ISO 9001 certified — material certs with every shipment.
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